Publications

SE3: Sequential Equivalence Checking for Non-Cycle-Accurate Design Transformations †

Published in 60th ACM/IEEE Design Automation Conference (DAC), 2023

This paper is about SE3, an efficient sequential equivalence checker without assumption on cycle-accuracy, latch mapping, or I/O interface of the checked circuits.

Recommended citation: Y. Li, G. Zhao, Y. He and H. Zhou, "SE3: Sequential Equivalence Checking for Non-Cycle-Accurate Design Transformations †," 2023 60th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 2023, pp. 1-6, doi: 10.1109/DAC56929.2023.10247912.

A Combination of DNN and BN for Automatic Skin Disease Diagnosis

Published in IEEE 20th International Symposium on Biomedical Imaging (ISBI), 2023

This paper is about an automatic skin disease diagnosis architecture that combines deep neural networks as nodes into Bayesian networks, which combines human knowledge with the perceptual results of deep learning tools.

Recommended citation: Y. He, L. Cai, T. Cui, Y. Li and H. Zhou, "A Combination of DNN and BN for Automatic Skin Disease Diagnosis," 2023 IEEE 20th International Symposium on Biomedical Imaging (ISBI), Cartagena, Colombia, 2023, pp. 1-5, doi: 10.1109/ISBI53787.2023.10230768.

ObfusLock: An Efficient Obfuscated Locking Framework for Circuit IP Protection†

Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023

This paper is about ObfusLock, a novel logic locking scheme that simultaneously achieves I/O attack resilience, structural attack resilience, locking efficiency and protection diversity.

Recommended citation: Y. Li, G. Zhao, Y. He and H. Zhou, "ObfusLock: An Efficient Obfuscated Locking Framework for Circuit IP Protection†," 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 2023, pp. 1-6, doi: 10.23919/DATE56975.2023.10136964.