SE3: Sequential Equivalence Checking for Non-Cycle-Accurate Design Transformations †
Published in 60th ACM/IEEE Design Automation Conference (DAC), 2023
This paper is about SE3, an efficient sequential equivalence checker without assumption on cycle-accuracy, latch mapping, or I/O interface of the checked circuits.
Recommended citation: Y. Li, G. Zhao, Y. He and H. Zhou, "SE3: Sequential Equivalence Checking for Non-Cycle-Accurate Design Transformations †," 2023 60th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 2023, pp. 1-6, doi: 10.1109/DAC56929.2023.10247912.